A new x-ray backscatter sensor, Model 318 from NDC Infrared Engineering Inc., Irwindale, Calif., reportedly measures film and sheet thickness from one side of the web with the same performance as NDC's two-sided nuclear beta transmission gauge. Since the gauge is single-sided, the scanning frame is simpler, less expensive, and easier to fit on the processing line. The x-ray backscatter sensor, which will be shown for the first time at NPE in Chicago next month, uses an ionization chamber to detect reflected x-rays. It avoids the licensing requirements that can accompany nucleonic devices. NDC is only the second company to offer a single-sided x-ray thickness sensor. At NPE 2003, Automation & Control Technology (ACT) Inc., Dublin, Ohio, introduced a device with a patented solid-state detector, rather than an ionization chamber, adjacent to the x-ray transmitter.
NDC Infrared Engineering
5314 N. Irwindale Ave. Irwindale, CA 91706
Phone (626) 960-3300 Fax (626) 939-3870